Several models exist, that quantify the effective lifetime of electrons and holes, respectively, as a function of the fluence and, partially, the temperature.
The fluence needs to be provided to the corresponding propagation module, and is always interpreted as 1-MeV neutron equivalent fluence~\cite{niel}.
The decision on whether a charge carrier has been trapped during a step during the propagation process is calculated similarly to the recombination precesses, described in \ref{sec:recombination}.
The decision on whether a charge carrier has been trapped during a step during the propagation process is calculated similarly to the recombination processes, described in \ref{sec:recombination}.
It should be noted that the trapping of charge carriers is only one of several effects induced by radiation damage.
In \apsq, these effects are treated independently, i.e. defining the fluence for a propagation module will not affect any other process than trapping.
@@ -512,6 +512,25 @@ In addition, for most modules, the parameters have been extracted under certain
A dependency on annealing conditions has not been implemented here.
Please refer to the corresponding reference publications for further details.
The trapping probability is calculated as an exponential decay as a function of the simulation timestep as