Commit ffaa2db2 authored by Simon Spannagel's avatar Simon Spannagel
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Amend manual to reflect detrapping

(cherry picked from commit 677b2590)
parent 2f76f135
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+21 −2
Original line number Diff line number Diff line
@@ -502,7 +502,7 @@ lifetime_hole = 4.5ns
Several models exist, that quantify the effective lifetime of electrons and holes, respectively, as a function of the fluence and, partially, the temperature.
The fluence needs to be provided to the corresponding propagation module, and is always interpreted as 1-MeV neutron equivalent fluence~\cite{niel}.

The decision on whether a charge carrier has been trapped during a step during the propagation process is calculated similarly to the recombination precesses, described in \ref{sec:recombination}.
The decision on whether a charge carrier has been trapped during a step during the propagation process is calculated similarly to the recombination processes, described in \ref{sec:recombination}.

It should be noted that the trapping of charge carriers is only one of several effects induced by radiation damage.
In \apsq, these effects are treated independently, i.e. defining the fluence for a propagation module will not affect any other process than trapping.
@@ -512,6 +512,25 @@ In addition, for most modules, the parameters have been extracted under certain
A dependency on annealing conditions has not been implemented here.
Please refer to the corresponding reference publications for further details.

The trapping probability is calculated as an exponential decay as a function of the simulation timestep as

\begin{equation*}
p_{e, h} = \left(1 - \exp^{1 \frac{\delta t}{\tau_{e, h}}}\right)
\end{equation*}

where $\delta t$ is the simulation timestep and $\tau{e,h}$ the effective lifetime of electrons and holes, respectively.
At the same time, a total time spent in the trap is calculated if a detrapping model is selected. Here, the time until the
charge carrier is de-trapped is calculated as

\begin{equation*}
\delta t = - \tau_{e.h} \ln{1-p}
\end{equation*}

where $p$ is a probability random chosen from a uniform distribution between 0 and 1.
The detrapping is configured via the \parameter{detrapping_model} parameter. Currently, only \parameter{detrapping_model = "none"} and
\parameter{detrapping_model = "constant"} are supported. The latter requires the parameters \parameter{detrapping_time_electron} and
\parameter{detrapping_time_hole} to be configured.

The following models for trapping of charge carriers can be selected.

\subsection{Ljubljana}