Added all of the citations from old Endnote files to Bibtex (a7142205) · Commits · Mukherjee, Debangshu / Multi Particle 4D-STEM Paper

.DS_Store

+2 KiB (10 KiB)

File changed.

No diff preview for this file type.

View original file

View changed file

.vscode/ltex.dictionary.en-US.txt

0 → 100644

+4 −0

Original line number	Diff line number	Diff line
		nanodiffraction
		nanobeam
		NBED
		CBED

Combined_4DSTEM.bib

+277 −6

Original line number	Diff line number	Diff line
		@@ -6,7 +6,7 @@
		number={3},
		pages={437--472},
		year={1996},
		url={https://journals.ametsoc.org/view/journals/bams/77/3/1520-0477_1996_077_0437_tnyrp_2_0_co_2.xml},
		url={https://doi.org/10.1175/1520-0477(1996)077%3C0437:TNYRP%3E2.0.CO;2},
		publisher={American Meteorological Society}
		}

		@@ -18,7 +18,7 @@
		number={4},
		pages={361--385},
		year={1964},
		url={https://journals.ametsoc.org/view/journals/atsc/21/4/1520-0469_1964_021_0361_teotaw_2_0_co_2.xml},
		url={https://doi.org/10.1175/1520-0469(1964)021%3C0361:TEOTAW%3E2.0.CO;2},
		publisher={American Meteorological Society}
		}

		@@ -88,7 +88,7 @@
		volume={18},
		number={6},
		pages={3746--3751},
		url={https://pubs.acs.org/doi/abs/10.1021/acs.nanolett.8b00952},
		url={https://doi.org/10.1021/acs.nanolett.8b00952},
		year={2018},
		publisher={ACS Publications}
		}
		@@ -99,20 +99,20 @@
		journal={Ultramicroscopy},
		volume={214},
		pages={112994},
		url={https://www.sciencedirect.com/science/article/abs/pii/S0304399119303377},
		url={https://doi.org/10.1016/j.ultramic.2020.112994},
		year={2020},
		publisher={Elsevier}
		}

		@article{strain_tensor,
		title={Imaging Short-range Order and Extracting 3-D Strain Tensor Using Energy-filtered {4D-STEM} Techniques},
		title={Imaging Short-range Order and Extracting {3--D} Strain Tensor Using Energy-filtered {4D--STEM} Techniques},
		author={Zhang, Ruopeng and Zeltmann, Steven and Ophus, Colin and Savitzky, Benjamin and Pekin, Thomas and Rothchild, Eric and Bustillo, Karen and Asta, Mark and Chrzan, Daryl and Minor, Andrew},
		journal={Microscopy and Microanalysis},
		volume={26},
		number={S2},
		pages={936--938},
		year={2020},
		url={https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/imaging-shortrange-order-and-extracting-3d-strain-tensor-using-energyfiltered-4dstem-techniques/},
		url={https://doi.org/10.1017/S1431927620016396},
		publisher={Cambridge University Press}
		}

		@@ -139,3 +139,274 @@
		url={https://www.sciencedirect.com/science/article/pii/S2542435118304549},
		publisher={Elsevier}
		}

		@article{core_shell_ordered_np,
		title={Structurally ordered intermetallic platinum--cobalt core--shell nanoparticles with enhanced activity and stability as oxygen reduction electrocatalysts},
		author={Wang, Deli and Xin, Huolin L and Hovden, Robert and Wang, Hongsen and Yu, Yingchao and Muller, David A and DiSalvo, Francis J and Abru{\~n}a, H{\'e}ctor D},
		journal={Nature Materials},
		volume={12},
		number={1},
		pages={81--87},
		year={2013},
		publisher={Nature Publishing Group},
		url={https://www.nature.com/articles/nmat3458},
		}

		@article{ultralow_ptco,
		title={Ultralow--loading platinum-cobalt fuel cell catalysts derived from imidazolate frameworks},
		author={Chong, Lina and Wen, Jianguo and Kubal, Joseph and Sen, Fatih G and Zou, Jianxin and Greeley, Jeffery and Chan, Maria and Barkholtz, Heather and Ding, Wenjiang and Liu, Di-Jia},
		journal={Science},
		volume={362},
		number={6420},
		pages={1276--1281},
		year={2018},
		publisher={American Association for the Advancement of Science},
		url={https://doi.org/10.1126/science.aau0630},
		}

		@article{structured_ptco,
		title={Au-Doped Stable {$\mathrm{L1_0}$} Structured Platinum Cobalt Ordered Intermetallic Nanoparticle Catalysts for Enhanced Electrocatalysis},
		author={Kuttiyiel, Kurian A and Kattel, Shyam and Cheng, Shaobo and Lee, Ji Hoon and Wu, Lijun and Zhu, Yimei and Park, Gu-Gon and Liu, Ping and Sasaki, Kotaro and Chen, Jingguang G and Adzic, Radoslav R},
		journal={ACS Applied Energy Materials},
		volume={1},
		number={8},
		pages={3771--3777},
		year={2018},
		publisher={ACS Publications},
		url={https://pubs.acs.org/doi/full/10.1021/acsaem.8b00555},
		}

		@article{core_shell_ptco,
		title={Thermal stability of platinum--cobalt bimetallic nanoparticles: chemically disordered alloys, ordered intermetallics, and core--shell structures},
		author={Huang, Rao and Shao, Gui-Fang and Zhang, Yang and Wen, Yu-Hua},
		journal={ACS Applied Materials \& Interfaces},
		volume={9},
		number={14},
		pages={12486--12493},
		year={2017},
		publisher={ACS Publications},
		url={https://pubs.acs.org/doi/full/10.1021/acsami.7b01337},
		}

		@article{random_vs_structured,
		title={Random alloyed versus intermetallic nanoparticles: A comparison of electrocatalytic performance},
		author={Gamler, Jocelyn TL and Ashberry, Hannah M and Skrabalak, Sara E and Koczkur, Kallum M},
		journal={Advanced Materials},
		volume={30},
		number={40},
		pages={1801563},
		year={2018},
		publisher={Wiley Online Library},
		url={https://doi.org/10.1002/adma.201801563},
		}

		@article{strain_tem_vs_stem,
		title={Quantitative analysis of interfacial strain in {InAs/GaSb} superlattices by aberration-corrected {HRTEM} and {HAADF--STEM}},
		author={Mahalingam, Krishnamurthy and Haugan, Heather J and Brown, Gail J and Eyink, Kurt G},
		journal={Ultramicroscopy},
		volume={127},
		pages={70--75},
		year={2013},
		publisher={Elsevier},
		url={https://doi.org/10.1016/j.ultramic.2012.09.005},
		}

		@article{gpa_strain,
		title={Practical and reproducible mapping of strains in {Si} devices using geometric phase analysis of annular dark-field images from scanning transmission electron microscopy},
		author={Chung, Jayhoon and Lian, Guoda and Rabenberg, Lew},
		journal={IEEE Electron Device Letters},
		volume={31},
		number={8},
		pages={854--856},
		year={2010},
		publisher={IEEE},
		url={https://doi.org/10.1109/LED.2010.2049562},
		}

		@article{original_gpa,
		title={Quantitative measurement of displacement and strain fields from {HREM} micrographs},
		author={H{\"y}tch, MJ and Snoeck, E and Kilaas, R},
		journal={Ultramicroscopy},
		volume={74},
		number={3},
		pages={131--146},
		year={1998},
		publisher={Elsevier},
		url={https://doi.org/10.1016/S0304-3991(98)00035-7},
		}

		@article{hrem_strain,
		title={Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy},
		author={H{\"u}e, Florian and H{\"y}tch, Martin and Bender, Hugo and Houdellier, Florent and Claverie, Alain},
		journal={Physical Review Letters},
		volume={100},
		number={15},
		pages={156602},
		year={2008},
		publisher={APS},
		url={https://doi.org/10.1103/PhysRevLett.100.156602},
		}

		@article{ef_cbed_strain,
		title={Analysis of local strain in aluminium interconnects by energy filtered CBED},
		author={Kr{\"a}mer, S and Mayer, J and Witt, C and Weickenmeier, A and R{\"u}hle, M},
		journal={Ultramicroscopy},
		volume={81},
		number={3-4},
		pages={245--262},
		year={2000},
		publisher={Elsevier},
		url={https://doi.org/10.1016/S0304-3991(99)00191-6},
		}

		@article{revstem,
		title={Revolving scanning transmission electron microscopy: {C}orrecting sample drift distortion without prior knowledge},
		author={Sang, Xiahan and LeBeau, James M},
		journal={Ultramicroscopy},
		volume={138},
		pages={28--35},
		year={2014},
		publisher={Elsevier},
		url={https://doi.org/10.1016/j.ultramic.2013.12.004},
		}

		@article{colin_drift,
		title={Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions},
		author={Ophus, Colin and Ciston, Jim and Nelson, Chris T},
		journal={Ultramicroscopy},
		volume={162},
		pages={1--9},
		year={2016},
		publisher={Elsevier},
		url={https://doi.org/10.1016/j.ultramic.2015.12.002},
		}

		@article{lewys_drift,
		title={Identifying and correcting scan noise and drift in the scanning transmission electron microscope},
		author={Jones, Lewys and Nellist, Peter D},
		journal={Microscopy and Microanalysis},
		volume={19},
		number={4},
		pages={1050--1060},
		year={2013},
		publisher={Cambridge University Press},
		url={https://doi.org/10.1017/S1431927613001402},
		}

		@article{kevin_drift,
		title={Identification and correction of temporal and spatial distortions in scanning transmission electron microscopy},
		author={Roccapriore, Kevin M and Creange, Nicole and Ziatdinov, Maxim and Kalinin, Sergei V},
		journal={Ultramicroscopy},
		volume={229},
		pages={113337},
		year={2021},
		publisher={Elsevier},
		url={https://doi.org/10.1016/j.ultramic.2021.113337},
		}

		@article{colin_review,
		title={Four-dimensional scanning transmission electron microscopy {(4D-STEM)}: From scanning nanodiffraction to ptychography and beyond},
		author={Ophus, Colin},
		journal={Microscopy and Microanalysis},
		volume={25},
		number={3},
		pages={563--582},
		year={2019},
		publisher={Cambridge University Press},
		url={https://doi.org/10.1017/S1431927619000497},
		}

		@article{nbed_strain1,
		title={Strain mapping at nanometer resolution using advanced nano-beam electron diffraction},
		author={Ozdol, VB and Gammer, C and Jin, XG and Ercius, P and Ophus, C and Ciston, J and Minor, AM},
		journal={Applied Physics Letters},
		volume={106},
		number={25},
		pages={253107},
		year={2015},
		publisher={AIP Publishing LLC},
		url={https://doi.org/10.1063/1.4922994},
		}

		@article{neg_capacitance,
		title={Spatially resolved steady-state negative capacitance},
		author={Yadav, Ajay K and Nguyen, Kayla X and Hong, Zijian and Garc{\'\i}a-Fern{\'a}ndez, Pablo and Aguado-Puente, Pablo and Nelson, Christopher T and Das, Sujit and Prasad, Bhagwati and Kwon, Daewoong and Cheema, Suraj and Khan, Asif I and Hu, Chenming and {\'I}{\~n}iguez, Jorge and Junquera, Javier and Chen, Long-Qing and Muller, David A and Ramesh, Ramamoorthy and Salahuddin, Sayeef},
		journal={Nature},
		volume={565},
		number={7740},
		pages={468--471},
		year={2019},
		publisher={Nature Publishing Group},
		url={https://doi.org/10.1038/s41586-018-0855-y},
		}

		@article{ptycho_deep,
		title={Electron ptychography of {2D} materials to deep sub-{\aa}ngstr{\"o}m resolution},
		author={Jiang, Yi and Chen, Zhen and Han, Yimo and Deb, Pratiti and Gao, Hui and Xie, Saien and Purohit, Prafull and Tate, Mark W and Park, Jiwoong and Gruner, Sol M and Elser, Veit and Muller, David A},
		journal={Nature},
		volume={559},
		number={7714},
		pages={343--349},
		year={2018},
		publisher={Nature Publishing Group},
		url={https://doi.org/10.1038/s41586-018-0298-5},
		}

		@article{ncem_camera,
		title={The {4D} camera--An 87 {kHz} frame-rate detector for counted {4D-STEM} experiments},
		author={Ercius, Peter and Johnson, Ian and Brown, Hamish and Pelz, Philipp and Hsu, Shang-Lin and Draney, Brent and Fong, Erin and Goldschmidt, Azriel and Joseph, John and Lee, Jason and Ciston, Jim and Ophus, Colin and Scott, Mary C and Selvarajan, Ashwin and Paul, David and Skinner, David and Hanwell, Marcus and Harris, Chris and Avery, Patrick and Stezelberger, Thorsten and Tindall, Craig and Ramesh, Ramamoorthy and Minor, Andrew and Denes, Peter},
		journal={Microscopy and Microanalysis},
		volume={26},
		number={S2},
		pages={1896--1897},
		year={2020},
		publisher={Cambridge University Press},
		url={https://doi.org/10.1017/S1431927620019753},
		}

		@article{4dstem_nanoparticles,
		title={Lattice strain measurement of {Core@Shell} electrocatalysts with {4D} scanning transmission electron microscopy nanobeam electron diffraction},
		author={Mukherjee, Debangshu and Gamler, Jocelyn T L and Skrabalak, Sara E and Unocic, Raymond R},
		journal={ACS Catalysis},
		volume={10},
		number={10},
		pages={5529--5541},
		year={2020},
		publisher={ACS Publications},
		url={https://doi.org/10.1021/acscatal.0c00224},
		}

		@article{holo_strain,
		title={Strain mapping for the semiconductor industry by dark-field electron holography and nanobeam electron diffraction with nm resolution},
		author={Cooper, David and B{\'e}ch{\'e}, Armand and Hartmann, Jean Michel and Carron, Veronique and Rouvi{\`e}re, Jean-Luc},
		journal={Semiconductor science and technology},
		volume={25},
		number={9},
		pages={095012},
		year={2010},
		publisher={IOP Publishing},
		url={https://doi.org/10.1088/0268-1242/25/9/095012},
		}

		@article{disk_registration,
		title={Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping},
		author={Pekin, Thomas C and Gammer, Christoph and Ciston, Jim and Minor, Andrew M and Ophus, Colin},
		journal={Ultramicroscopy},
		volume={176},
		pages={170--176},
		year={2017},
		publisher={Elsevier},
		url={https://doi.org/10.1016/j.ultramic.2016.12.021},
		}

		@article{nbed_strain2,
		title={Improved precision in strain measurement using nanobeam electron diffraction},
		author={B{\'e}ch{\'e}, A and Rouvi{\`e}re, JL and Cl{\'e}ment, L and Hartmann, JM},
		journal={Applied Physics Letters},
		volume={95},
		number={12},
		pages={123114},
		year={2009},
		publisher={American Institute of Physics},
		url={https://doi.org/10.1063/1.3224886},
		}
		No newline at end of file

Combined_4DSTEM.pdf

+13.5 KiB (3.32 MiB)

File changed.

No diff preview for this file type.

View original file

View changed file

Combined_4DSTEM.tex

+16 −13

File changed.

Preview size limit exceeded, changes collapsed.